A NEW HIGH-PRECISION OPTICAL TECHNIQUE TO MEASURE MAGNETOSTRICTION OF A THIN MAGNETIC-FILM DEPOSITED ON A SUBSTRATE

被引：95
作者：
TAM, AC
SCHROEDER, H
机构：
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1989年 / 25卷 / 03期
关键词：
D O I：
10.1109/20.24502
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：2629 / 2638
页数：10
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