LOW-ENERGY X-RAY AND GAMMA-SPECTROSCOPY USING SILICON PIN PHOTODIODES

被引：13
作者：
MARKEVICH, N
GERTNER, I
FELSTEINER, J
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1988年 / 269卷 / 01期
关键词：
D O I：
10.1016/0168-9002(88)90881-9
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：219 / 221
页数：3
相关论文
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NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1985, 239 (03) :518-526
[2]   PERFORMANCE AND APPLICATIONS OF ROOM-TEMPERATURE SILICON PASSIVATED ION-IMPLANTED X-RAY-DETECTORS [J].
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IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1984, 31 (01) :344-347
[3]  
YAMAMOTO H, 1984, Radioisotopes, V33, P864, DOI 10.3769/radioisotopes.33.12_864
[4]  
1985, SILICON PHOTOCEL JAN, P24
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