FOREIGN IMAGING IN AUGER-SPECTROSCOPY - THE SI 2P SPECTRUM OF SILICON TETRAFLUORIDE

被引：60

作者：

TARANTELLI, F ^{[1
]}

CEDERBAUM, LS ^{[1
]}

机构：

[1] UNIV HEIDELBERG,W-6900 HEIDELBERG,GERMANY

来源：

PHYSICAL REVIEW LETTERS | 1993年 / 71卷 / 04期

关键词：

D O I：

10.1103/PhysRevLett.71.649

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We performed Green's function calculations on the double ionization of SiF4 in order to interpret its Si 2p Auger spectrum, which has caused controversy for a decade. We provide an accurate interpretation and a model of far wider generality in the Auger study of ionic species. Contrary to the usual self-imaging picture of Auger spectroscopy, the silicon spectrum exhibits eight distinct bands reflecting a complete and precise image of the fluorine ligands, due to strong hole-localization effects. The generality of this foreign-imaging character of Auger spectroscopy is discussed.

引用

页码：649 / 652

页数：4

共 13 条

[1] SI(LVV) AUGER AND RESONANCE AUGER-SPECTRA OF SIF4 MOLECULES WITH THE USE OF SYNCHROTRON RADIATION [J].