SINGLE-PARAMETER SCALING AND CONDUCTANCE OF 2D SYSTEMS AT THE SILICON SURFACE

被引：0
|
作者：
DOROZHKIN, SI [1 ]
KVON, ZD [1 ]
OLSHANETSKII, EB [1 ]
GUSEV, GM [1 ]
机构：
[1] ACAD SCI USSR,INST SEMICOND PHYS,NOVOSIBIRSK,USSR
来源：
JETP LETTERS | 1987年 / 45卷 / 12期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：737 / 739
页数：3
相关论文
共 50 条
  • [21] An Intuitive Stability Analysis Method for Single-Parameter Variations in Linear Systems
    Cheng, Cheng
    Xie, Shaojun
    Xu, Jinming
    Qian, Qiang
    IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2024, 71 (03) : 3219 - 3223
  • [22] Exact robust H2 performance analysis for linear single-parameter dependent systems
    Fukumoto, Hiroko
    Fujisaki, Yasumasa
    PROCEEDINGS OF THE 46TH IEEE CONFERENCE ON DECISION AND CONTROL, VOLS 1-14, 2007, : 4268 - +
  • [23] Spatial mapping of disordered 2D systems: The conductance Sudoku
    Mukim, S.
    Lewenkopf, C.
    Ferreira, M. S.
    CARBON, 2022, 188 : 360 - 366
  • [24] A SINGLE-PARAMETER METHOD FOR THE DETERMINATION OF SURFACE-TENSION AND CONTACT-ANGLE
    KUIKEN, HK
    COLLOIDS AND SURFACES, 1991, 59 : 129 - 148
  • [25] BREAKDOWN OF UNIVERSALITY IN THE CONDUCTANCE FLUCTUATIONS INDUCED IN 2D DISORDERED MESOSCOPIC SYSTEMS BY THE MOTION OF A SINGLE IMPURITY
    BEALMONOD, MT
    FORGACS, G
    PHYSICA B, 1994, 194 : 1003 - 1004
  • [26] Surface polaritons in 2D macroporous silicon structures
    Karachevtseva, Lyudmyla
    Karas, Mikola
    Onishchenko, Volodimir
    Sizov, Fedir
    INTERNATIONAL JOURNAL OF NANOTECHNOLOGY, 2006, 3 (01) : 76 - 88
  • [27] QUANTIZED PLATEAUS OF THE HALL CONDUCTANCE OF 2D ELECTRON-SYSTEMS
    ISIHARA, A
    SURFACE SCIENCE, 1986, 170 (1-2) : 267 - 270
  • [28] Parameter-dependent Lyapunov functions for exact stability analysis of single-parameter dependent LTI systems
    Zhang, XP
    Tsiotras, P
    Iwasaki, T
    42ND IEEE CONFERENCE ON DECISION AND CONTROL, VOLS 1-6, PROCEEDINGS, 2003, : 5168 - 5173
  • [29] Scaling Laws in the Dynamics of Collapse of Single Bubbles and 2D Foams
    Dominguez, Claudia
    Leyes, Marcos Fernandez
    Cuenca, Victor E.
    Ritacco, Hernan A.
    LANGMUIR, 2020, 36 (50) : 15386 - 15395
  • [30] The End of the Road for 2D Scaling of Silicon CMOS and the Future of Device Technology
    Wong, H. -S. Philip
    2018 76TH DEVICE RESEARCH CONFERENCE (DRC), 2018,
12345