SCANNING ELECTRON-MICROSCOPE CHARGE-COLLECTION IMAGES OF GRAIN-BOUNDARIES

被引：41
作者：
MAREK, J
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1982年 / 53卷 / 03期
关键词：
D O I：
10.1063/1.330640
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：1454 / 1460
页数：7
相关论文
共 25 条
[1]  
ANDERSEN CA, 1966, ELECTRON MICROPROBE, P58
[2]  
AUTHIER B, 1978, FESTKORPERPROBLEME, V18, P1
[3]  
BLOSS WH, 1980, 3RD EC PHOT SOL EN C, P340
[4]   COMPUTER-SIMULATION OF SEM ELECTRON-BEAM INDUCED CURRENT IMAGES OF DISLOCATIONS AND STACKING-FAULTS [J].
DONOLATO, C ;
KLANN, H .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (03) :1624-1633
[5]   CONTRAST AND RESOLUTION OF SEM CHARGE-COLLECTION IMAGES OF DISLOCATIONS [J].
DONOLATO, C .
APPLIED PHYSICS LETTERS, 1979, 34 (01) :80-81
[6]   QUANTITATIVE PROPERTIES OF SEM-EBIC IMAGES OF STACKING-FAULTS IN SILICON [J].
DONOLATO, C .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (12) :L771-L774
[7]  
DONOLATO C, 1979, 12TH P ANN SEM S, P257
[8]  
DRESCHER H, 1970, Z ANGEW PHYSIK, V29, P331
[9]   DETERMINATION OF KILOVOLT ELECTRON ENERGY DISSIPATION VS PENETRATION DISTANCE IN SOLID MATERIALS [J].
EVERHART, TE ;
HOFF, PH .
JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) :5837-&
[10]   LOW-COST SOLAR-CELLS BASED ON LARGE-AREA UNCONVENTIONAL SILICON [J].
FISCHER, H ;
PSCHUNDER, W .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1977, 24 (04) :438-442
123