ELECTRON-ENERGY LOSS SPECTRA AS AN ADDITIONAL PROOF OF THE NON-SUITABILITY OF ELECTRON EXCITED SPECTROSCOPIES FOR STUDIES OF THE ELECTRONIC-STRUCTURE OF VANADIUM PENTOXIDE

被引：0

作者：

CURELARU, IM

SUONINEN, E

MINNI, E

STRID, KG

RONNHULT, T

机构：

[1] UNIV TURKU,DEPT PHYS SCI,SF-20500 TURKU 50,FINLAND

[2] CHALMERS UNIV TECHNOL,DEPT ENGN MAT,S-41296 GOTEBORG,SWEDEN

来源：

JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1981年 / 6卷 / 01期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：9 / 16

页数：8

共 50 条

[1] AN XPS ARGUMENT AGAINST THE USE OF ELECTRON EXCITED SPECTROSCOPIES IN STUDIES OF THE ELECTRONIC-STRUCTURE OF VANADIUM PENTOXIDE
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