X-RAY STUDIES OF TI-N COATINGS

被引:4
作者
ZHANG, N [1 ]
ZHAI, W [1 ]
WANG, Y [1 ]
WAGENDRISTEL, A [1 ]
机构
[1] VIENNA TECH UNIV,INST APPL & TECH PHYS,A-1040 VIENNA,AUSTRIA
基金
中国国家自然科学基金;
关键词
D O I
10.1016/0042-207X(93)90012-Y
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Detailed studies of Ti-N coatings deposited either by hollow cathode evaporation or by ion sputtering onto high speed steel have been performed. Phase identification, texture and profile analysis were carried out from X-ray diffraction data. A series of stable and unstable phases were found. The (111) texture was dominant in all cases. Dislocation density and configuration were determined by X-ray profile analysis to give an estimate of coating hardness.
引用
收藏
页码:51 / 53
页数:3
相关论文
共 7 条
[1]  
GARBRIEL HM, 1984, THIN SOLID FILMS, V118, P243
[2]   MICROSTRUCTURE AND HARDNESS OF TI(C,N) COATINGS ON STEEL PREPARED BY THE ACTIVATED REACTIVE EVAPORATION TECHNIQUE [J].
JACOBSON, BE ;
DESHPANDEY, CV ;
DOERR, HJ ;
KARIM, AA ;
BUNSHAH, RF .
THIN SOLID FILMS, 1984, 118 (03) :285-292
[3]   THE STRUCTURE AND COLOR OF SOME NITRIDE COATINGS [J].
PERRY, AJ .
THIN SOLID FILMS, 1986, 135 (01) :73-85
[4]   EPSILON-TI2N PHASE GROWTH-CONTROL IN TITANIUM NITRIDE FILMS [J].
POULEK, V ;
MUSIL, J ;
CERNY, R ;
KUZEL, R .
THIN SOLID FILMS, 1989, 170 (02) :L55-L58
[5]   YOUNG MODULUS OF TIN, TIC, ZRN AND HFN [J].
TOROK, E ;
PERRY, AJ ;
CHOLLET, L ;
SPROUL, WD .
THIN SOLID FILMS, 1987, 153 :37-43
[6]  
WANG Y, 1987, APPL PHYS A, V35, P109
[7]  
Wang Y M, 1982, J APPL CRYSTALLOGR, V15, P35