FURTHER DEVELOPMENTS IN SEMI-QUANTITATIVE SIMS

[1] GERIGK W, 1979, 2ND INT SIMS C STANF

[2] LOTOTSKII AG, 1976, J ANAL CHEM-USSR+, V31, P373

[3] MOLECULAR VERSUS ATOMIC SECONDARY ION EMISSION FROM SOLIDS [J]. JOURNAL OF CHEMICAL PHYSICS, 1978, 68 (08) : 3900 - 3909

[4] MORGAN AE, 1977, J MICROSC SPECT ELEC, V2, P285

[5] MORGAN AE, 1978, MIKROCHIM ACTA, V2, P31

[6] MORGAN AE, UNPUBLISHED

[7] DETECTOR DISCRIMINATION IN SIMS - ION-TO-ELECTRON CONVERTER YIELD FACTORS FOR POSITIVE-IONS [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1978, 27 (03): : 249 - 261

[8] ATOMIC RADII IN CRYSTALS [J]. JOURNAL OF CHEMICAL PHYSICS, 1964, 41 (10) : 3199 - &

[1] GERIGK W, 1979, 2ND INT SIMS C STANF

[2] LOTOTSKII AG, 1976, J ANAL CHEM-USSR+, V31, P373

[3] MOLECULAR VERSUS ATOMIC SECONDARY ION EMISSION FROM SOLIDS [J]. JOURNAL OF CHEMICAL PHYSICS, 1978, 68 (08) : 3900 - 3909

[4] MORGAN AE, 1977, J MICROSC SPECT ELEC, V2, P285

[5] MORGAN AE, 1978, MIKROCHIM ACTA, V2, P31

[6] MORGAN AE, UNPUBLISHED

[7] DETECTOR DISCRIMINATION IN SIMS - ION-TO-ELECTRON CONVERTER YIELD FACTORS FOR POSITIVE-IONS [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1978, 27 (03): : 249 - 261

[8] ATOMIC RADII IN CRYSTALS [J]. JOURNAL OF CHEMICAL PHYSICS, 1964, 41 (10) : 3199 - &