LATERAL BEAM STABILITY OF A COMPUTER-ASSISTED SCANNING ELECTRON-MICROSCOPE X-RAY-MICROANALYSIS SYSTEM

被引：0

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作者：

WURSTER, R

LEHNER, S

机构：

来源：

SCANNING | 1987年 / 9卷 / 03期

关键词：

D O I：

10.1002/sca.4950090305

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

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页码：117 / 123

页数：7

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