Electron microscopic determination of surface elevations and orientations

被引：38

作者：

Heidenreich, RD ^{[1
]}

Matheson, LA ^{[1
]}

机构：

[1] Dow Chem Co, Midland, MI USA

来源：

JOURNAL OF APPLIED PHYSICS | 1944年 / 15卷 / 05期

关键词：

D O I：

10.1063/1.1707450

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：423 / 435

页数：13

共 19 条

[1]

ANDERSON TF, 1942, ADV COLLOID SCI, V1, P361

[2]

BAGLEY JW, 1941, AEROPHOTOGRAPHY AERO, pCH9

[3]

BARRETT CS, 1943, METALS TECH, V10

[4] The electron microscope - Calibration and use at low magnifications [J].

Burton, CJ ;

Barnes, RB ;

Rochow, TG .

INDUSTRIAL AND ENGINEERING CHEMISTRY, 1942, 34 :1429-1436

[5]

EITEL W, 1940, NATURWISSENSCHAFTEN, V28, P367

[6]

GOLZ E, 1943, Z TECH PHYS, V24, P8

[7] Fine structure of metallic surfaces with the electron microscope [J].

Heidenreich, RD ;

Peck, VG .

JOURNAL OF APPLIED PHYSICS, 1943, 14 (01) :23-29

[8] Electron reflections in MgO crystals with the electron microscope [J].

Heidenreich, RD .

PHYSICAL REVIEW, 1942, 62 (5/6) :291-292

[9] Interpretation of electron micrographs of silica surface replicas [J].

Heidenreich, RD .

JOURNAL OF APPLIED PHYSICS, 1943, 14 (07) :312-320

[10] The observation of crystalline reflections in electron microscope images [J].

Hillier, J ;

Baker, RF .

PHYSICAL REVIEW, 1942, 61 (11/12) :722-723

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