USE OF SCANNING AND TRANSMISSION ELECTRON-MICROSCOPES FOR FRACTOGRAPHIC ANALYSIS OF STEELS

被引：0

作者：

KALNER, VD

ZELENOVA, VD

SHERMAZAN, IV

KIRILLOVA, MP

机构：

[1] MOSCOW AUTOMOBILE PLANT,MOSCOW,USSR

[2] MOSCOW CENT AUTOMOBILE & AUTOM ENGN RES & DESIGN INST,MOSCOW,USSR

来源：

METAL SCIENCE AND HEAT TREATMENT | 1974年 / 16卷 / 7-8期

关键词：

Compendex;

D O I：

10.1007/BF00658430

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

IRON AND STEEL METALLOGRAPHY

引用

页码：656 / 659

页数：4

共 26 条

[1] TECHNIQUE FOR DETECTION OF IONS IN HIGH-VOLTAGE ELECTRON-MICROSCOPES
MCKINLEY, GV
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1978, 36 (1-2): : 29 - 33
[2] EXTENSION OF SCANNING-TRANSMISSION ELECTRON-MICROSCOPY BY USE OF DIFFRACTION INFORMATION
COWLEY, JM
ULTRAMICROSCOPY, 1976, 1 (03) : 255 - 262
[3] MEASUREMENT OF SENSITIVITY OF TRANSMISSION ELECTRON MICROSCOPES TO AC MAGNETIC FIELD.
Gemperle, A.
Gemperlova, J.
Optik (Jena), 1979, 53 (05): : 367 - 380
[4] FEASIBILITY OF STUDYING AND CONVERTING HIGHLY MINIATURIZED MICROFILMS WITH SCANNING ELECTRON MICROSCOPES.
Kan, A.Z.
Karelin, N.M.
Petrov, V.I.
Rau, E.I.
1600,
[5] Seal bond characterization of laminated plastic food cups by scanning electron and optic microscopes
Ayhan, Zehra
Pack Technol Sci, 4 (205-211):
[6] SCANNING TRANSMISSION ELECTRON MICROSCOPE ANALYSIS OF SOLUTE PARTITIONING IN A PARTIALLY STABILIZED ZIRCONIA.
Rao, B.V.Narasimha
Schreiber, T.P.
Research Publication - General Motors Research Laboratories, 1980, (GMR-3252):
[7] Imaging nanobubbles in water with scanning transmission electron microscopy
Department of Physics and Astronomy, California NanoSystems Institute, University of California, Los Angeles, CA 90095, United States
不详
Appl. Phys. Express, 5
[8] Measurements of Resolution in Scanning Transmission Electron Microscopy of Thick Objects.
Gentsch, P.
Reimer, L.
1600, (37):
[9] LOW-COST IMAGE ANALYSIS SYSTEM FOR SCANNING TRANSMISSION ELECTRON MICROSCOPY LOW-DOSE IMAGES.
Crewe, A.V.
Scanning Electron Microscopy, 1982, (pt 4) : 1597 - 1601
[10] USE OF AN REM-200 SCANNING MICROSCOPE FOR SCANNING ELECTRON-BEAM ANNEALING.
Sainov, N.A.
1600, (26):

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