SURFACE-RESISTANCE AND PENETRATION DEPTH OF YBA2CU3O7-DELTA THIN-FILMS ON SILICON AT ULTRAHIGH FREQUENCIES

被引：15

作者：

JAEKEL, C ^{[1
]}

WASCHKE, C ^{[1
]}

ROSKOS, HG ^{[1
]}

KURZ, H ^{[1
]}

机构：

[1] TECH UNIV MUNICH,DEPT PHYS E10,D-85747 GARCHING,GERMANY

来源：

APPLIED PHYSICS LETTERS | 1994年 / 64卷 / 24期

关键词：

D O I：

10.1063/1.111267

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The surface resistance R(s) and the absolute value of the magnetic penetration depth lambda of ultrathin YBa2Cu3O7-delta filMS on silicon are determined by THz-pulse transmission experiments. We find a minimal value of R(s) for a film thickness of about 30 nn. The increase of R(s) with film thickness above 30 nm reveals an increase of the density of weak links possibly associated with the formation of microfractures even below the critical film thickness of 50-70 nm.

引用

页码：3326 / 3328

页数：3

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