X-RAY-DIFFRACTION

被引：4
|
作者：
PFLUGER, CE
机构：
来源：
ANALYTICAL CHEMISTRY | 1972年 / 44卷 / 05期
关键词：
D O I：
10.1021/ac60313a023
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：R563 / &
相关论文
共 50 条
  • [1] X-RAY-DIFFRACTION
    PFLUGER, CE
    ANALYTICAL CHEMISTRY, 1974, 46 (05) : R469 - R478
  • [2] X-RAY-DIFFRACTION
    SMITH, DK
    SMITH, KL
    ANALYTICAL CHEMISTRY, 1980, 52 (05) : R122 - R131
  • [3] X-RAY-DIFFRACTION
    SAGURTON, JR
    GIORDANO, J
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (01): : 102 - 102
  • [4] X-RAY-DIFFRACTION
    PFLUGER, CE
    ANALYTICAL CHEMISTRY, 1976, 48 (05) : R362 - R368
  • [5] X-RAY-DIFFRACTION
    SMITH, DK
    SMITH, KL
    ANALYTICAL CHEMISTRY, 1982, 54 (05) : R156 - R165
  • [6] X-RAY-DIFFRACTION
    PFLUGER, CE
    ANALYTICAL CHEMISTRY, 1978, 50 (05) : R161 - R166
  • [7] X-RAY-DIFFRACTION
    WINSTANLEY, R
    CHEMISTRY IN BRITAIN, 1975, 11 (12) : 440 - 440
  • [8] X-RAY-DIFFRACTION ANALYSIS
    RUIZ, P
    DELMON, B
    GARCIN, E
    SURANTYN, R
    VOLTA, JC
    GIMENEZ, MT
    NOGIER, JP
    THORET, J
    OUDET, F
    COURTINE, P
    DEBOER, M
    VANDILLEN, AJ
    GEUS, JW
    DELARCO, M
    MARTIN, C
    RIVES, V
    ANDERSSON, A
    MAJUNKE, AF
    BAERNS, M
    CATALYSIS TODAY, 1994, 20 (01) : 17 - 22
  • [9] DYNAMIC X-RAY-DIFFRACTION
    WALES, CP
    CHIANELLI, RR
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (06) : 990 - 991
  • [10] X-RAY-DIFFRACTION IN MULTILAYERS
    LEE, P
    OPTICS COMMUNICATIONS, 1981, 37 (03) : 159 - 164
12345