首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
SUPER LOW-NOISE GAAS-MESFETS WITH A DEEP-RECESS STRUCTURE
被引:32
|
作者
:
OHATA, K
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD,DIV MICROWAVE & SATELLITE COMMUN,MIDORI KU,YOKOHAMA,JAPAN
NIPPON ELECT CO LTD,DIV MICROWAVE & SATELLITE COMMUN,MIDORI KU,YOKOHAMA,JAPAN
OHATA, K
[
1
]
ITOH, H
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD,DIV MICROWAVE & SATELLITE COMMUN,MIDORI KU,YOKOHAMA,JAPAN
NIPPON ELECT CO LTD,DIV MICROWAVE & SATELLITE COMMUN,MIDORI KU,YOKOHAMA,JAPAN
ITOH, H
[
1
]
HASEGAWA, F
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD,DIV MICROWAVE & SATELLITE COMMUN,MIDORI KU,YOKOHAMA,JAPAN
NIPPON ELECT CO LTD,DIV MICROWAVE & SATELLITE COMMUN,MIDORI KU,YOKOHAMA,JAPAN
HASEGAWA, F
[
1
]
FUJIKI, Y
论文数:
0
引用数:
0
h-index:
0
机构:
NIPPON ELECT CO LTD,DIV MICROWAVE & SATELLITE COMMUN,MIDORI KU,YOKOHAMA,JAPAN
NIPPON ELECT CO LTD,DIV MICROWAVE & SATELLITE COMMUN,MIDORI KU,YOKOHAMA,JAPAN
FUJIKI, Y
[
1
]
机构
:
[1]
NIPPON ELECT CO LTD,DIV MICROWAVE & SATELLITE COMMUN,MIDORI KU,YOKOHAMA,JAPAN
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1980年
/ 27卷
/ 06期
关键词
:
D O I
:
10.1109/T-ED.1980.19982
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:1029 / 1034
页数:6
相关论文
共 50 条
[31]
OUTPUT IMPEDANCE FREQUENCY DISPERSION AND LOW-FREQUENCY NOISE IN GAAS-MESFETS
GITLIN, D
论文数:
0
引用数:
0
h-index:
0
GITLIN, D
VISWANATHAN, CR
论文数:
0
引用数:
0
h-index:
0
VISWANATHAN, CR
ABIDI, AA
论文数:
0
引用数:
0
h-index:
0
ABIDI, AA
JOURNAL DE PHYSIQUE,
1988,
49
(C-4):
: 201
-
204
[32]
EMPIRICAL DETERMINATION OF THE NOISE-FIGURE OF GAAS-MESFETS
AHMED, MK
论文数:
0
引用数:
0
h-index:
0
AHMED, MK
FREQUENZ,
1984,
38
(12)
: 313
-
317
[33]
LOW-FREQUENCY OSCILLATIONS IN GAAS-MESFETS
ABDALA, MA
论文数:
0
引用数:
0
h-index:
0
机构:
School of Physics and Materials, Lancaster University, Lancaster
ABDALA, MA
JONES, BK
论文数:
0
引用数:
0
h-index:
0
机构:
School of Physics and Materials, Lancaster University, Lancaster
JONES, BK
SOLID-STATE ELECTRONICS,
1993,
36
(02)
: 237
-
245
[34]
GAAS POWER MESFETS WITH A GRADED RECESS STRUCTURE
FURUTSUKA, T
论文数:
0
引用数:
0
h-index:
0
FURUTSUKA, T
HIGASHISAKA, A
论文数:
0
引用数:
0
h-index:
0
HIGASHISAKA, A
AONO, Y
论文数:
0
引用数:
0
h-index:
0
AONO, Y
TAKAYAMA, Y
论文数:
0
引用数:
0
h-index:
0
TAKAYAMA, Y
HASEGAWA, F
论文数:
0
引用数:
0
h-index:
0
HASEGAWA, F
ELECTRONICS LETTERS,
1979,
15
(14)
: 417
-
418
[35]
NOISE CHARACTERIZATION OF GAAS-MESFETS FOR THE DESIGN OF OPTICAL AMPLIFIERS
PERRI, AG
论文数:
0
引用数:
0
h-index:
0
PERRI, AG
ARMENISE, MN
论文数:
0
引用数:
0
h-index:
0
ARMENISE, MN
CORSI, F
论文数:
0
引用数:
0
h-index:
0
CORSI, F
OPTICAL ENGINEERING,
1990,
29
(04)
: 385
-
390
[36]
OPTIMAL NOISE-FIGURE OF MICROWAVE GAAS-MESFETS
FUKUI, H
论文数:
0
引用数:
0
h-index:
0
FUKUI, H
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(07)
: 1032
-
1037
[37]
COMPARISON OF 1/F NOISE OF ALGAAS/GAAS HEMTS AND GAAS-MESFETS
TACANO, M
论文数:
0
引用数:
0
h-index:
0
机构:
Electrotechnical Laboratory, Tsukuba, Ibaraki, 305
TACANO, M
SUGIYAMA, Y
论文数:
0
引用数:
0
h-index:
0
机构:
Electrotechnical Laboratory, Tsukuba, Ibaraki, 305
SUGIYAMA, Y
SOLID-STATE ELECTRONICS,
1991,
34
(10)
: 1049
-
1053
[38]
ON THE PHOTORESPONSE OF GAAS-MESFETS - BACKGATING AND DEEP TRAPS EFFECT
PAPAIONANNOU, GJ
论文数:
0
引用数:
0
h-index:
0
机构:
MARCONI DEF SYST LTD,STANMORE HA7 4LY,MIDDX,ENGLAND
MARCONI DEF SYST LTD,STANMORE HA7 4LY,MIDDX,ENGLAND
PAPAIONANNOU, GJ
FORREST, JR
论文数:
0
引用数:
0
h-index:
0
机构:
MARCONI DEF SYST LTD,STANMORE HA7 4LY,MIDDX,ENGLAND
MARCONI DEF SYST LTD,STANMORE HA7 4LY,MIDDX,ENGLAND
FORREST, JR
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1986,
33
(03)
: 373
-
378
[39]
MICROWAVE NOISE CHARACTERIZATION OF GAAS-MESFETS - DETERMINATION OF EXTRINSIC NOISE PARAMETERS
GUPTA, MS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN & COMP SCI,CHICAGO,IL 60680
GUPTA, MS
GREILING, PT
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN & COMP SCI,CHICAGO,IL 60680
GREILING, PT
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,
1988,
36
(04)
: 745
-
751
[40]
Gate-drain breakdown and microwave noise of GaAs-MESFETs
Heymann, Peter,
1600,
(43):
←
1
2
3
4
5
→