TRANSFORMATION OF CL BONDING STRUCTURES ON SI(100)-(2X1)

被引:41
作者
CHENG, CC [1 ]
GAO, Q [1 ]
CHOYKE, WJ [1 ]
YATES, JT [1 ]
机构
[1] UNIV PITTSBURGH,DEPT PHYS,PITTSBURGH,PA 15260
来源
PHYSICAL REVIEW B | 1992年 / 46卷 / 19期
关键词
D O I
10.1103/PhysRevB.46.12810
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The digital electron-stimulated-desorption ion angular distribution (ESDIAD) method has been used to observe the existence and the irreversible thermal transformation between different bonding structures for Cl on the Si(100)-(2 X 1) surface. The ESDIAD pattern produced from dissociative chemisorption of Cl2 at 120 K shows intense normal emission of Cl+, plus lower intensity of Cl+ emission focused along the [011] and [011BAR] axes (the axes Of Si2 dimer orientations in two domains). Upon annealing (T less-than-or-equal-to 673 K), the Cl+ ESDIAD pattern is irreversibly transformed into a four-beam pattern with a twofold azimuthal symmetry in the plane of each dimer axis, indicative of the formation of energetically stable Si-Cl bonds inclined 25-degrees +/- 4-degrees from the surface normal.
引用
收藏
页码:12810 / 12813
页数:4
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