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DETERMINATION OF DELAYED PHOTOSYNTHETIC APPARATUS LUMINESCENCE AS A POSSIBLE METHOD OF FROST-RESISTANCE EVALUATION IN WHEAT LEAVES
被引：0
作者：
BRZOSTOWICZ, A
机构：
关键词：
CONDUCTOMETRIC METHOD;
DELAYED LUMINESCENCE OF PHOTOSYNTHETIC APPARATUS;
FROST RESISTANCE;
HARDENING PROCESS;
WHEAT;
D O I：
暂无
中图分类号：
Q94 [植物学];
学科分类号：
071001 ;
摘要：
The influence of frost hardening on temperature (t) dependent delayed luminescence intensity (IDL) of photosynthetic apparatus in five wheat cultivars of different frost resistance was studied. Statistically highly significant correlations between selected parameters describing IDL temperature dependence and frost resistance of tissue as evaluated with the conductometric method were found.
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页码：187 / 191
页数：5
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