ELECTRON MICRO-DIFFRACTION STUDIES OF THE POTENTIAL-FIELD AT CRYSTAL-SURFACES

被引：18
作者：
COWLEY, JM
机构：
来源：
ULTRAMICROSCOPY | 1981年 / 7卷 / 02期
关键词：
D O I：
10.1016/0304-3991(81)90008-5
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：181 / 188
页数：8
相关论文
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COWLEY JM, 1981, ULTRAMICROSCOPY, V6, P359, DOI 10.1016/S0304-3991(81)80237-9
[2]   COHERENT INTERFERENCE IN CONVERGENT-BEAM ELECTRON-DIFFRACTION AND SHADOW IMAGING [J].
COWLEY, JM .
ULTRAMICROSCOPY, 1979, 4 (04) :435-450
[3]   LINE PATTERNS IN WIDE-ANGLE CONVERGENT BEAM ELECTRON DIFFRACTION [J].
SMITH, DJ ;
COWLEY, JM .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (DEC1) :482-&
[4]   APPROXIMATIONS FOR DYNAMICAL CALCULATIONS OF MICRO-DIFFRACTION PATTERNS AND IMAGES OF DEFECTS [J].
SPENCE, JCH .
ACTA CRYSTALLOGRAPHICA SECTION A, 1978, 34 (JAN) :112-116
[5]  
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