HIGH-RESOLUTION ELECTRON-MICROSCOPY AND X-RAY-DIFFRACTION STUDIES OF MCM-48

被引：123
|
作者：
SCHMIDT, R [1 ]
STOCKER, M [1 ]
AKPORIAYE, D [1 ]
TORSTAD, EH [1 ]
OLSEN, A [1 ]
机构：
[1] UNIV OSLO,CTR MAT RES,DEPT PHYS,N-0371 OSLO,NORWAY
来源：
MICROPOROUS MATERIALS | 1995年 / 5卷 / 1-2期
关键词：
M41S; MCM-48; HIGH-RESOLUTION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; PORE ARCHITECTURE;
D O I：
10.1016/0927-6513(95)00030-D
中图分类号：
O69 [应用化学];
学科分类号：
081704 ;
摘要：
A cubic member of the M41S family with a three-dimensional pore system, denoted as MCM-48, was synthesised. By combining X-ray powder diffraction (XRD) with high-resolution electron microscopy (HREM), a cubic symmetry with an Ia(3) over bar d space group was determined for the as-synthesised and the calcined MCM-48 material. Upon calcination the unit cell decreased from around 10.09 nm to about 8.1 nm. The overall pore structure was found to be quite unaffected by local variations in the structure and the decrease in the unit cell size upon calcination.
引用
收藏
页码：1 / 7
页数：7
相关论文
共 50 条
  • [41] High resolution X-ray diffraction studies on hexaphenyl thin films
    Resel, R
    Leising, G
    SURFACE SCIENCE, 1998, 409 (02) : 302 - 306
  • [42] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF DISLOCATIONS IN A B2-TYPE INTERMETALLIC COMPOUND COTI
    SHINDO, D
    YOSHIDA, M
    LEE, BT
    TAKASUGI, T
    HIRAGA, K
    INTERMETALLICS, 1995, 3 (02) : 167 - 171
  • [43] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF DISLOCATIONS IN COSI2 WITH THE C1 STRUCTURE
    SUZUKI, K
    TAKEUCHI, S
    INTERMETALLICS, 1993, 1 (01) : 21 - 27
  • [44] Towards a high-resolution volumetric X-ray diffraction imaging system for biospecimen
    Gude, Zachary
    Coccarelli, Dave
    Kapadia, Anuj J.
    McCall, Shannon
    Greenberg, Joel A.
    MEDICAL IMAGING 2024: PHYSICS OF MEDICAL IMAGING, PT 1, 2024, 12925
  • [45] Investigation of HgTe-HgCdTe superlattices by high-resolution x-ray diffraction
    Hatch, S. D.
    Sewell, R. H.
    Dell, J. M.
    Faraone, L.
    Becker, C. R.
    Usher, B.
    JOURNAL OF ELECTRONIC MATERIALS, 2006, 35 (06) : 1481 - 1486
  • [46] Strain relaxation in Ge microcrystals studied by high-resolution X-ray diffraction
    Rozboril, Jakub
    Meduna, Mojmir
    Falub, Claudiu Valentin
    Isa, Fabio
    von Kaenel, Hans
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2016, 213 (02): : 463 - 469
  • [47] Study of atomic diffusion in crystalline structures by high-resolution X-ray diffraction
    Avrahami, Y
    Shilo, D
    Mainzer, N
    Zolotoyabko, E
    JOURNAL OF CRYSTAL GROWTH, 1999, 198 : 264 - 269
  • [48] Investigation of HgTe-HgCdTe superlattices by high-resolution X-ray diffraction
    S. D. Hatch
    R. H. Sewell
    J. M. Dell
    L. Faraone
    C. R. Becker
    B. Usher
    Journal of Electronic Materials, 2006, 35 : 1481 - 1486
  • [49] X-RAY DIFFRACTION AND TRANSMISSION ELECTRON MICROSCOPY STUDIES ON NICKEL DOPED CdS NANOPARTICLES
    Rao, B. Srinivasa
    Kumar, B. Rajesh
    Reddy, V. Rajagopal
    Rao, T. Subba
    DIGEST JOURNAL OF NANOMATERIALS AND BIOSTRUCTURES, 2011, 6 (04) : 1709 - 1716
  • [50] Direct structure analysis of advanced nanomaterials by high-resolution electron microscopy
    Oku, Takeo
    NANOTECHNOLOGY REVIEWS, 2012, 1 (05) : 389 - 425
12345