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- [4] REVERSAL CONTRAST AND REGISTRATION OF ATOM CLUSTERS IN THROUGH-FOCUS SERIES OF ELECTRON-MICROGRAPHS JOURNAL OF ELECTRON MICROSCOPY, 1982, 31 (03): : 327 - 327
- [5] COMPUTER IMAGE-PROCESSING FOR REDUCTION OF NOISE DUE TO PHASE-CONTRAST AND IMAGE-CONTRAST ENHANCEMENT OF ELECTRON-MICROGRAPHS WITH THE AID OF A DIGITAL SCANNING DENSITOMETER SYSTEM JOURNAL OF ELECTRON MICROSCOPY, 1981, 30 (03): : 261 - 262
- [6] METHOD FOR DETERMINATION OF ANGLE OF ILLUMINATION FROM OPTICAL DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1977, 2 (03): : A7 - A7
- [8] STRUCTURAL STUDIES OF MACROMOLECULAR ASSEMBLIES BY IMAGE-RECONSTRUCTION FROM ELECTRON-MICROGRAPHS JOURNAL OF ELECTRON MICROSCOPY, 1977, 26 (01): : 64 - 64
- [10] IMAGE-RECONSTRUCTION FROM ELECTRON-MICROGRAPHS BY MAXIMUM-ENTROPY METHOD OPTIK, 1981, 58 (04): : 233 - 239