SURFACE ATOMIC GEOMETRY OF COVALENTLY BONDED SEMICONDUCTORS - INSB(110) AND ITS COMPARISON WITH GAAS(110) AND ZNTE(110)

被引:20
作者
DUKE, CB [1 ]
MEYER, RJ [1 ]
PATON, A [1 ]
YEH, JL [1 ]
TSANG, JC [1 ]
KAHN, A [1 ]
MARK, P [1 ]
机构
[1] PRINCETON UNIV, DEPT ELECT ENGN, PRINCETON, NJ 08540 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1980年 / 17卷 / 01期
关键词
D O I
10.1116/1.570494
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:501 / 505
页数:5
相关论文
共 21 条
[1]   IONICITY EFFECTS ON COMPOUND SEMICONDUCTOR (110) SURFACES [J].
BAUER, RS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1977, 14 (04) :899-903
[2]   (110) SURFACE ATOMIC STRUCTURES OF COVALENT AND IONIC SEMICONDUCTORS [J].
CHADI, DJ .
PHYSICAL REVIEW B, 1979, 19 (04) :2074-2082
[3]  
CHADI DJ, UNPUBLISHED
[4]  
Duke C.B., 1974, DYNAMIC ASPECTS SURF, P99
[5]  
Duke C.B., 1974, ADV CHEM PHYS, V27, P1
[6]   ATOMIC GEOMETRY OF CLEAVAGE SURFACES OF TETRAHEDRALLY COORDINATED COMPOUND SEMICONDUCTORS [J].
DUKE, CB ;
LUBINSKY, AR ;
LEE, BW ;
MARK, P .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (04) :761-768
[7]   SURFACE-STRUCTURE AND BONDING [J].
DUKE, CB .
MATERIALS SCIENCE AND ENGINEERING, 1976, 25 (SEP-O) :13-17
[8]   CALCULATION OF LOW-ENERGY-ELECTRON-DIFFRACTION INTENSITIES FROM ZNO (1010) .2. INFLUENCE OF CALCULATIONAL PROCEDURE, MODEL POTENTIAL, AND 2ND-LAYER STRUCTURAL DISTORTIONS [J].
DUKE, CB ;
MEYER, RJ ;
PATON, A ;
MARK, P .
PHYSICAL REVIEW B, 1978, 18 (08) :4225-4240
[9]   LOW-ENERGY-ELECTRON-DIFFRACTION ANALYSIS OF ATOMIC GEOMETRY OF ZNO(1010) [J].
DUKE, CB ;
LUBINSKY, AR ;
CHANG, SC ;
LEE, BW ;
MARK, P .
PHYSICAL REVIEW B, 1977, 15 (10) :4865-4873
[10]   ANALYSIS OF ELEED INTENSITIES FROM ZNTE(110) [J].
DUKE, CB ;
MEYER, RJ ;
PATON, A ;
MARK, P ;
SO, E ;
YEH, JL .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02) :647-650