A METHOD OF DETERMINING THE LIFETIME AND DIFFUSION-COEFFICIENT OF MINORITY-CARRIERS IN A SEMICONDUCTOR WAFER

被引：13

|

作者：

SUZUKI, E

HAYASHI, Y

机构：

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1989年 / 36卷 / 06期

关键词：

D O I：

10.1109/16.24361

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：1150 / 1154

页数：5

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