DESIGN-PROBLEMS OF VLSI SEMICONDUCTOR MEMORY INTEGRATED-CIRCUITS

被引：0

|

作者：

RHEIN, D

机构：

来源：

JOURNAL OF INFORMATION RECORDING MATERIALS | 1987年 / 15卷 / 01期

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：25 / 34

页数：10

相关论文

共 50 条

[41] COMPUTER-AIDED-DESIGN OF INTEGRATED-CIRCUITS
CARTER, HW
COMPUTER, 1986, 19 (04) : 19 - &
[42] ON AN INTERACTIVE OPTIMIZATION METHOD FOR THE DESIGN OF INTEGRATED-CIRCUITS
LEIBNER, P
AEU-ARCHIV FUR ELEKTRONIK UND UBERTRAGUNGSTECHNIK-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS, 1986, 40 (01): : 1 - 9
[43] DEFINING AND COMPARING COMPUTING EFFICIENCY IN SEMICONDUCTOR AND OPTOELECTRONIC INTEGRATED-CIRCUITS
SVIDZINSKII, KK
SOVIET MICROELECTRONICS, 1986, 15 (02): : 63 - 71
[44] THE PROBLEMS OF TESTING LARGE-SCALE INTEGRATED-CIRCUITS
WATERS, DGP
BRITISH TELECOMMUNICATIONS ENGINEERING, 1982, 1 (JUL): : 64 - 69
[45] VLSI SYSTEM-DESIGN - WHEN AND HOW TO DESIGN VERY-LARGE-SCALE INTEGRATED-CIRCUITS - MUROGA,S
ZORNIG, J
AMERICAN SCIENTIST, 1983, 71 (06) : 662 - 663
[46] RELIABILITY OF PLASTIC ENCAPSULATED SEMICONDUCTOR-DEVICES AND INTEGRATED-CIRCUITS
REICH, B
SOLID STATE TECHNOLOGY, 1978, 21 (09) : 82 - 88
[47] DESIGN-PROBLEMS
GAISER, G
CENTRAL STATES SPEECH JOURNAL, 1962, 13 (03): : 194 - 194
[48] THE SEMICONDUCTOR RESEARCH CORPORATION AND UNIVERSITY-RESEARCH IN INTEGRATED-CIRCUITS
SUMNEY, LW
BURGER, RM
IEEE TRANSACTIONS ON EDUCATION, 1986, 29 (02) : 61 - 68
[49] PROGRESS REPORT ON STANDARDIZATION OF SEMICONDUCTOR-DEVICES AND INTEGRATED-CIRCUITS
FANTUZZO, D
ELETTROTECNICA, 1979, 66 (08): : 635 - 644
[50] AN INTEGRATED DESIGN AUTOMATION SYSTEM FOR VLSI CIRCUITS
KARATSU, O
HOSHINO, T
ENDO, M
KITAZAWA, H
ADACHI, T
UEDA, K
IEEE DESIGN & TEST OF COMPUTERS, 1985, 2 (05): : 17 - 26

← 1 2 3 4 5 →