STUDY OF THE INTERFACE OF UNDOPED AND P-DOPED ZNSE WITH GAAS AND ALAS

被引:46
作者
KASSEL, L [1 ]
ABAD, H [1 ]
GARLAND, JW [1 ]
RACCAH, PM [1 ]
POTTS, JE [1 ]
HAASE, MA [1 ]
CHENG, H [1 ]
机构
[1] THREE M CO,ST PAUL,MN 55144
关键词
D O I
10.1063/1.102641
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have used electrolyte electroreflectance (EER) to characterize ZnSe/GaAs and ZnSe/AlAs interfaces. The great sensitivity of EER to interface space-charge regions enabled us to detect both interface crossover transitions and transitions to triangular-well interface states. The observation of these transitions provides the first unambiguous proof that the ZnSe/GaAs interface is type I and allowed us to determine the band offsets and band bendings, the diffusion lengths across each interface, and the amount of interdiffusion.
引用
收藏
页码:42 / 44
页数:3
相关论文
共 8 条
[1]   STAGGERED BAND ALIGNMENTS IN ALGAAS HETEROJUNCTIONS AND THE DETERMINATION OF VALENCE-BAND OFFSETS [J].
DAWSON, P ;
WILSON, BA ;
TU, CW ;
MILLER, RC .
APPLIED PHYSICS LETTERS, 1986, 48 (08) :541-543
[2]   GROWTH OF UNDOPED ZNSE ON (100) GAAS BY MOLECULAR-BEAM EPITAXY - AN INVESTIGATION OF THE EFFECTS OF GROWTH TEMPERATURE AND BEAM PRESSURE RATIO [J].
DEPUYDT, JM ;
CHENG, H ;
POTTS, JE ;
SMITH, TL ;
MOHAPATRA, SK .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (12) :4756-4762
[3]  
GARLAND JW, 1986, SPIE P, V659, P32
[4]   A THEORY FOR THE ELECTROREFLECTANCE SPECTRA OF QUANTUM-WELL STRUCTURES [J].
KLIPSTEIN, PC ;
APSLEY, N .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1986, 19 (32) :6461-6478
[5]  
LANOO M, 1981, POINT DEFECTS SEMICO, V1, P226
[6]   BAND BENDINGS, BAND OFFSETS, AND INTERFACE INSTABILITIES IN P+-GAAS/N--ZNSE HETEROJUNCTIONS [J].
OLEGO, DJ .
PHYSICAL REVIEW B, 1989, 39 (17) :12743-12750
[7]   COMPARATIVE-STUDY OF DEFECTS IN SEMICONDUCTORS BY ELECTROLYTE ELECTROREFLECTANCE AND SPECTROSCOPIC ELLIPSOMETRY [J].
RACCAH, PM ;
GARLAND, JW ;
ZHANG, Z ;
LEE, U ;
XUE, DZ ;
ABELS, LL ;
UGUR, S ;
WILINSKY, W .
PHYSICAL REVIEW LETTERS, 1984, 53 (20) :1958-1961
[8]   ZNSE-GAAS AND SE-GAAS INTERFACES [J].
TU, DW ;
KAHN, A .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03) :922-925