SPECTRAL MEASUREMENTS OF STACK EFFLUENTS USING A DOUBLE-BEAM INTERFEROMETER WITH BACKGROUND SUPPRESSION

被引：4
作者：
SHEPHERD, O
HURD, AG
WATTSON, RB
SMITH, HJP
VANASSE, GA
机构：
来源：
APPLIED OPTICS | 1981年 / 20卷 / 22期
关键词：
D O I：
10.1364/AO.20.003972
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：3972 / 3980
页数：9
相关论文
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