EXAMINATION OF THIN-FILMS OF LOW-PRESSURE DIAMOND BY TRANSMISSION ELECTRON-MICROSCOPY

被引：2
|
作者：
CHATFIELD, C [1 ]
HAUBNER, R [1 ]
LUX, B [1 ]
机构：
[1] TECH UNIV VIENNA,INST CHEM TECHNOL INORGAN MAT,A-1060 VIENNA,AUSTRIA
来源：
JOURNAL OF MATERIALS SCIENCE LETTERS | 1989年 / 8卷 / 10期
关键词：
D O I：
10.1007/BF01730066
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：1188 / 1192
页数：5
相关论文
共 50 条
  • [41] INSITU TRANSMISSION ELECTRON-MICROSCOPY ANNEALING OF NICR THIN-FILMS WITH SIMULTANEOUS HALL-VOLTAGE MEASUREMENT
    TOTH, L
    BARNA, A
    SAFRAN, G
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04): : 1856 - 1859
  • [42] HEAT-SHOCK FRACTURING AND REPLICATION FOR THE ELECTRON-MICROSCOPY OF THIN-FILMS
    MULLER, T
    EDLINGER, J
    PULKER, HK
    ULTRAMICROSCOPY, 1992, 41 (1-3) : 89 - 98
  • [43] A TRANSMISSION ELECTRON-MICROSCOPY STRUCTURAL-ANALYSIS OF GASE THIN-FILMS GROWN ON SI(111) SUBSTRATES
    KOEBEL, A
    ZHENG, Y
    PETROFF, JF
    EDDRIEF, M
    VINH, LT
    SEBENNE, C
    JOURNAL OF CRYSTAL GROWTH, 1995, 154 (3-4) : 269 - 274
  • [44] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF ELECTROLUMINESCENT THIN-FILMS FABRICATED BY VARIOUS DEPOSITION METHODS
    THEIS, D
    OPPOLZER, H
    EBBINGHAUS, G
    SCHILD, S
    JOURNAL OF CRYSTAL GROWTH, 1983, 63 (01) : 47 - 57
  • [45] INSITU OBSERVATION OF MELT GROWTH-PROCESS OF BI(111) THIN-FILMS BY TRANSMISSION ELECTRON-MICROSCOPY
    TAKADA, K
    SUGAWARA, S
    WATANABE, J
    MATERIALS TRANSACTIONS JIM, 1993, 34 (04): : 297 - 304
  • [46] NODULAR GROWTH IN THIN-FILMS - PREPARATION AND TRANSMISSION ELECTRON-MICROSCOPY CHARACTERIZATION IN COCR LAYERS ON SILICON SUBSTRATES
    MATTHEIS, R
    THRUM, F
    ANKLAM, HJ
    THIN SOLID FILMS, 1990, 188 (02) : 335 - 340
  • [47] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY (HRTEM) AND IMAGE-ANALYSIS OF UPVC THIN-FILMS
    CLARK, DJM
    TRUSS, RW
    MICRON, 1994, 25 (06) : 547 - 550
  • [48] MAGNETIC-FIELD-MODULATED WRITTEN BITS IN TBFECO THIN-FILMS - TRANSMISSION ELECTRON-MICROSCOPY LORENTZ AND SCANNING ELECTRON-MICROSCOPY WITH POLARIZATION ANALYSIS STUDIES
    AESCHLIMANN, M
    SCHEINFEIN, M
    UNGURIS, J
    GREIDANUS, FJAM
    KLAHN, S
    JOURNAL OF APPLIED PHYSICS, 1990, 68 (09) : 4710 - 4718
  • [49] ELECTRON-MICROSCOPY OF FULLERENE THIN-FILMS GROWN ON SOLID-SURFACES
    SAITO, Y
    YOSHIKAWA, T
    ISHIKAWA, Y
    NAGASHIMA, H
    SHINOHARA, H
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1993, 19 (1-2): : 18 - 24
  • [50] SCANNING ELECTRON-MICROSCOPY OBSERVATIONS AND ELECTRICAL STUDY OF PZT THIN-FILMS
    MICHELET, A
    CHARTIER, JL
    HAFID, EM
    LEBIHAN, R
    FERROELECTRICS, 1992, 126 (1-4) : 377 - 382
12345