EXAMINATION OF THIN-FILMS OF LOW-PRESSURE DIAMOND BY TRANSMISSION ELECTRON-MICROSCOPY

被引：2

作者：

CHATFIELD, C ^{[1
]}

HAUBNER, R ^{[1
]}

LUX, B ^{[1
]}

机构：

[1] TECH UNIV VIENNA,INST CHEM TECHNOL INORGAN MAT,A-1060 VIENNA,AUSTRIA

来源：

JOURNAL OF MATERIALS SCIENCE LETTERS | 1989年 / 8卷 / 10期

关键词：

D O I：

10.1007/BF01730066

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1188 / 1192

页数：5

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