STRUCTURAL DISORDER AND ELECTRONIC PROPERTIES OF AMORPHOUS SILICON

被引:72
作者
CHING, WY [1 ]
LIN, CC [1 ]
GUTTMAN, L [1 ]
机构
[1] ARGONNE NATL LAB,ARGONNE,IL 60439
来源
PHYSICAL REVIEW B | 1977年 / 16卷 / 12期
关键词
D O I
10.1103/PhysRevB.16.5488
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:5488 / 5498
页数:11
相关论文
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