OPTICAL CHARACTERIZATION OF PURE ZNSE EPILAYERS GROWN BY METAL-ORGANIC VAPOR-PHASE EPITAXY

被引:9
作者
CHERGUI, A
VALENTA, J
LOISON, JL
ROBINO, M
PELANT, I
GRUN, JB
LEVY, R
BRIOT, O
AULOMBARD, RL
机构
[1] UNIV MONTPELLIER 2,CNRS,URA 357,ETUD SEMICOND GRP,F-34095 MONTPELLIER 5,FRANCE
[2] CHARLES UNIV,FAC MATH & PHYS,CR-12116 PRAGUE 2,CZECH REPUBLIC
关键词
D O I
10.1088/0268-1242/9/11/007
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Different ZnSe/GaAs epilayers prepared by low-pressure metal organic vapour-phase epitaxy under the conditions given by Nurmikko and Gunshor (1993 Physica B 185 16) are studied through their low-temperature transmission, reflection and photoluminescence spectra. Several samples are etched out from their GaAs substrate and the properties of as-grown surfaces and etched surfaces are compared. The etched samples seem to be free of in-plane strain and to behave like bulk ZnSe. The free-exciton excited state (n = 2) is clearly observed in transmission, reflection and luminescence spectra. We also studied the thermal quenching of the photoluminescence in order to confirm the origin of some bound-exciton centres.
引用
收藏
页码:2073 / 2079
页数:7
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