RADIATION FAILURE MODES IN CMOS INTEGRATED-CIRCUITS

被引：13
作者：
BURGHARD, RA [1 ]
GWYN, CW [1 ]
机构：
[1] SANDIA LABS, ALBUQUERQUE, NM 87115 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1973年 / NS20卷 / 06期
关键词：
D O I：
10.1109/TNS.1973.4327411
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：300 / 306
页数：7
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