SPURIOUS SIGNALS IN DIGITAL CMOS VLSI CIRCUITS - A PROPAGATION ANALYSIS

被引：21

作者：

MOLL, F

RUBIO, A

机构：

[1] Department of Electronic Engineering, E.T.S.E.T.B., Universitat Politecnica de Catalunya, 08034, Barcelona, c/ Jordi Girona Salgado s/n

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-ANALOG AND DIGITAL SIGNAL PROCESSING | 1992年 / 39卷 / 10期

关键词：

Digital integrated circuits - Logic circuits - Spurious signal noise;

D O I：

10.1109/82.199902

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Spurious signals may appear as a result of a variety of causes such as hazards, crosstalk, and others. These signals may produce transient or even permanent logic errors in digital circuits if they affect memory elements. This work deals with the analysis of the penetration capability and the calculation of the propagation depth of such signals through logic circuits. The results are useful to determine the domain of effect of spurious signals and to point out rules for its detection.

引用

页码：749 / 752

页数：4

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