共 50 条
- [32] MEASURING THE THICKNESS OF SEMICONDUCTOR FILMS BY AN INTERFEROMETRIC METHOD. Soviet Journal of Optical Technology (English translation of Optiko-Mekhanicheskaya Promyshlennost), 1975, 42 (01): : 46 - 47
- [33] New method for measuring thickness in thin transparent medium INTERNATIONAL CONFERENCE ON APPLICATIONS OF OPTICS AND PHOTONICS, 2011, 8001
- [34] METHOD FOR MEASURING THERMAL CONDUCTIVITY OF THIN FILMS MEASUREMENT TECHNIQUES-USSR, 1970, (03): : 483 - &
- [35] CONTACTLESS METHOD FOR MEASURING CONDUCTANCE OF THIN FILMS MEASUREMENT TECHNIQUES-USSR, 1966, (05): : 658 - &
- [37] METHOD FOR MEASURING ELECTRIC PARAMETERS OF THIN FILMS INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1967, (02): : 460 - &
- [39] A NEW INTERFEROMETRIC METHOD FOR MEASURING THICKNESS OF THICK FILMS JOURNAL OF SCIENTIFIC INSTRUMENTS, 1967, 44 (05): : 393 - &