ANOMALIES IN RESISTIVITY OF THIN BI FILMS

被引：5
作者：
GARCIA, N
KAO, YH
STRONGIN, M
机构：
[1] S.U.N.Y. at Stony Brook, Stony Brook, NY
[2] Brookhaven National Laboratory, Upton, NY
[3] Brookhaven National Laboratory, Upton, NY
来源：
PHYSICS LETTERS A | 1969年 / A 29卷 / 10期
关键词：
D O I：
10.1016/0375-9601(69)91137-2
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
For film thickness less than 400 Å, the value of the electron wavelength in Bi, hysteresis and other anomalies in the resistivity versus temperature curves are observed. © 1969.
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页码：631 / &
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