ELLIPSOMETRIC AND REFLECTANCE STUDIES OF GAAS ALAS SUPERLATTICES

被引：17

作者：

HUMLICEK, J ^{[1
]}

LUKES, F ^{[1
]}

NAVRATIL, K ^{[1
]}

GARRIGA, M ^{[1
]}

PLOOG, K ^{[1
]}

机构：

[1] MAX PLANCK INST,D-7000 STUTTGART 80,FED REP GER

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1989年 / 49卷 / 04期

关键词：

D O I：

10.1007/BF00615025

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：407 / 412

页数：6

共 13 条

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[8] ULTRATHIN-LAYER (ALAS)M(GAAS)M SUPERLATTICES WITH M = 1,2,3 GROWN BY MOLECULAR-BEAM EPITAXY [J].

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[9] ELLIPSOMETRIC STUDIES OF NATURAL FILMS ON GAAS [J].

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