IMPAIRMENT OF NOISE IMMUNITY OF DIGITAL MONOLITHIC INTEGRATED CIRCUITS CAUSED BY SUPPLY-LINE AND EARTH-LINE CURRENT SPIKES IN CONJUNCTION WITH COAXIAL-CABLE CONNECTIONS

被引：1

作者：

ABDELLATIF, M

STRUTT, MJO

机构：

来源：

关键词：

D O I：

10.1049/el:19700446

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：643 / +

页数：1

共 5 条

[1] Abdel-Latif M., 1969, Scientia Electrica, V15, P77
[2] A NEW INTEGRATED GATE ELIMINATING LINE REFLECTIONS IN HIGH-SPEED DIGITAL SYSTEMS
ABDELLATIF, M
STRUTT, MJO
[J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (06): : 936 - +
[3] ABDELLATIF M, 1968, ELECTRON LETT, V4, P496, DOI 10.1049/el:19680387
[4] ABDELLATIF M, 1970, VERFAHREN VORRICHTUN
[5] NOISE SUSCEPTIBILITY OF INTEGRATED CIRCUITS IN DIGITAL SYSTEMS
HOSIER, WJ
[J]. RADIO AND ELECTRONIC ENGINEER, 1968, 36 (05): : 291 - +