CONTROL OF COMPOSITION PROFILE IN MERCURY CADMIUM TELLURIDE FILMS PREPARED BY ISOTHERMAL VAPOR-PHASE EPITAXY

被引:0
作者
TAKEUCHI, N [1 ]
KOBAYASHI, H [1 ]
NODA, Y [1 ]
FURUKAWA, Y [1 ]
机构
[1] TOHOKU UNIV,FAC ENGN,DEPT MAT SCI,SENDAI 98077,JAPAN
来源
MATERIALS TRANSACTIONS JIM | 1994年 / 35卷 / 05期
关键词
MERCURY CADMIUM TELLURIDE; ISOTHERMAL VAPOR PHASE EPITAXY; COMPOSITION PROFILE;
D O I
10.2320/matertrans1989.35.370
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Hg1-xCdxTe (MCT) films were grown by using three kinds of source materials on conventional open tube isothermal vapor phase epitaxy. The composition profile was dependent on the source materials: HgTe and sintered MCT sources resulted low x thick film and high x thin film, respectively. By considering these effects, the mixture sources of HgTe and CdTe enabled to produce the films of flat composition profile with x is-approximately-equal-to 0.2 and thickness of 10 mum.
引用
收藏
页码:370 / 372
页数:3
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