A 2 NON-IDENTICAL 3-STATE UNITS REDUNDANT SYSTEM WITH COMMON-CAUSE FAILURES AND ONE STANDBY UNIT

被引：5

|

作者：

CHUNG, WK

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1981年 / 21卷 / 05期

关键词：

D O I：

10.1016/0026-2714(81)90062-7

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：707 / 709

页数：3

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