X-MODE BROAD-BAND REFLECTOMETRIC DENSITY PROFILE MEASUREMENTS ON DIII-D

被引:51
作者
DOYLE, EJ
LEHECKA, T
LUHMANN, NC
PEEBLES, WA
机构
关键词
D O I
10.1063/1.1141971
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A 50-75 GHz, X-mode, broadband reflectometer system is installed and operational on DIII-D. Density profiles have been obtained under a wide range of operating conditions, including Ohmic, L-, and H-mode operation. Good agreement has been found with profiles obtained by Thomson scattering, but only with the use of fast sweeps. Profiles are calculated from the line-integrated phase data using a stable numerical inversion algorithm. Using these techniques, and allowing for the reset time of the tube, density profiles can be measured every 2.5 ms. The system is still under development: By adding an additional 50-75 GHz BWO and mixers, the system will be reconfigured to also act as a correlation reflectometer.
引用
收藏
页码:2896 / 2898
页数:3
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