LONG-DISTANCE ELECTRONIC SPECKLE PATTERN INTERFEROMETRY

被引：23
|
作者：
LOKBERG, OJ [1 ]
MALMO, JT [1 ]
机构：
[1] FDN SCI & IND RES, N-7034 TRONDHEIM, NORWAY
来源：
OPTICAL ENGINEERING | 1988年 / 27卷 / 02期
关键词：
LIGHT - Speckle - OPTICAL INSTRUMENTS;
D O I：
10.1117/12.7976660
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Electronic speckle pattern interferometry has been used to measure the vibrations and deformations of objects located far from the optical head. Vibration recordings were made for a total path-length difference of up to 200 m with the object outdoors in bright sunshine. This limit was determined by practical considerations. For deformation recordings, turbulence and mechanical instabilities create a problem, and a more realistic limit is a path-length difference of about 50 m under stable, indoor conditions.
引用
收藏
页码：150 / 156
页数：7
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