ION-IMPLANTATION IN AMORPHOUS-GERMANIUM AND SILICON

被引:5
作者
SEKHAR, P [1 ]
JOSHI, MC [1 ]
NARASIMHAN, KL [1 ]
GUHA, S [1 ]
机构
[1] TATA INST FUNDAMENTAL RES,BOMBAY 400005,INDIA
关键词
D O I
10.1016/0038-1098(78)91255-3
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:933 / 936
页数:4
相关论文
共 11 条
[1]   OPTICAL AND ELECTRICAL PROPERTIES OF BORON-IMPLANTED AMORPHOUS-GERMANIUM THIN-FILMS [J].
ANDERSON, GW ;
DAVEY, JE ;
COMAS, J ;
SAKS, NS ;
LUCKE, WH .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (10) :4528-4533
[2]   PROPERTIES OF AMORPHOUS SILICON FILMS - DEPENDENCE ON DEPOSITION CONDITIONS [J].
BAHL, SK ;
BHAGAT, SM .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1975, 17 (03) :409-427
[3]   CONNECTION BETWEEN ESR AND ELECTRICAL-CONDUCTION IN AMORPHOUS SI FILMS [J].
HASEGAWA, S ;
YAZAKI, S .
SOLID STATE COMMUNICATIONS, 1977, 23 (01) :41-44
[4]   CONDUCTION IN NON-CRYSTALLINE MATERIALS .3. LOCALIZED STATES IN A PSEUDOGAP AND NEAR EXTREMITIES OF CONDUCTION AND VALENCE BANDS [J].
MOTT, NF .
PHILOSOPHICAL MAGAZINE, 1969, 19 (160) :835-&
[5]   INFLUENCE OF STRUCTURAL DAMAGE ON ELECTRONIC PROPERTIES OF AMORPHOUS GERMANIUM [J].
OLLEY, JA .
SOLID STATE COMMUNICATIONS, 1973, 13 (09) :1441-1444
[6]  
OLLEY JA, 1975, SOLID STATE COMMUN A, V30, P231
[7]   ELECTRICAL-CONDUCTION MECHANISMS IN THIN AMORPHOUS-SEMICONDUCTOR FILMS [J].
PAUL, W .
THIN SOLID FILMS, 1976, 33 (03) :381-396
[8]   DOPING, SCHOTTKY-BARRIER AND P-N-JUNCTION FORMATION IN AMORPHOUS-GERMANIUM AND SILICON BY RF SPUTTERING [J].
PAUL, W ;
LEWIS, AJ ;
CONNELL, GAN ;
MOUSTAKAS, TD .
SOLID STATE COMMUNICATIONS, 1976, 20 (10) :969-972
[9]   PHOTO AND DARK CONDUCTIVITY OF DOPED AMORPHOUS SILICON [J].
REHM, W ;
FISCHER, R ;
STUKE, J ;
WAGNER, H .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1977, 79 (02) :539-547
[10]  
Spear W. E., 1974, 5th International Conference on amorphous and liquid semiconductors, Vol.I, P1