共 50 条
[42]
X-ray topographic observation of magnetic domain structures induced by stresses
[J].
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES,
1999, 357 (1761)
:2689-2700
[45]
X-RAY TOPOGRAPHIC OBSERVATION OF SINGLE DISLOCATION MOBILITY IN SILICON.
[J].
Crystal Lattice Defects,
1973, 4 (01)
:29-36
[46]
X-ray topographic characterization of growth defects in sillenite type crystals
[J].
ANNALES DE CHIMIE-SCIENCE DES MATERIAUX,
1997, 22 (08)
:687-690
[47]
X-ray topographic characterization of growth defects in silenite type crystals
[J].
Anna Chim Sci Mater,
8 (687)
[48]
INVESTIGATION OF DEFECTS IN INSB SINGLE CRYSTALS BY X-RAY TOPOGRAPHIC METHODS
[J].
SOVIET PHYSICS SOLID STATE,USSR,
1969, 10 (07)
:1678-+
[50]
X-RAY TOPOGRAPHIC STUDY ON PHASE-TRANSITION OF FERROELECTRIC CRYSTALS
[J].
ACTA CRYSTALLOGRAPHICA SECTION A,
1972, 28
:S183-S183