For methodology for the quantitative measurement of the scattering of X-rays on microcrystalline layers.

被引：6

作者：

Brentano, J.

机构：

来源：

ZEITSCHRIFT FUR PHYSIK | 1936年 / 99卷 / 1-2期

关键词：

D O I：

10.1007/BF01847814

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：65 / 72

页数：8

共 10 条

[1] BAXTER A, 1931, Z PHYS, V70, P74
[2] Brentano J, 1925, P PHYS SOC LOND, V37, P184
[3] Conditions determining the intensity of X-ray reflections from microcrystalline layers
Brentano, J
[J]. NATURE, 1935, 136 : 988 - 988
[4] On a procedure for direct photo parameterization low blacken and its application in the evaluation of X-ray-F-values.
Brentano, J.
[J]. ZEITSCHRIFT FUR PHYSIK, 1931, 70 (1-2): : 74 - 83
[5] Brentano J, 1928, PHILOS MAG, V6, P178
[6] Brentano J, 1927, PHILOS MAG, V4, P620
[7] Provision of atomic Scattering Values for X-Rays in the Region of the L-Absorption Edges
Brentano, J.
Baxter, A.
[J]. ZEITSCHRIFT FUR PHYSIK, 1934, 89 (11-12): : 720 - 735
[8] BRENTANO JCM, 1935, P PHYS SOC LOND, V47, P932
[9] BRINDLEY GW, 1935, P LEEDS PHILOS LIT S, V3, P73
[10] Nuclear factor of provisions in the area of anomalous dispersion. II
Schaefer, Karl
[J]. ZEITSCHRIFT FUR PHYSIK, 1933, 86 (11-12): : 738 - 759