THE USE OF DIRECT CONVOLUTION PRODUCTS IN PROFILE AND PATTERN FITTING ALGORITHMS .1. DEVELOPMENT OF THE ALGORITHMS

被引：60

作者：

HOWARD, SA ^{[1
]}

SNYDER, RL ^{[1
]}

机构：

[1] ALFRED UNIV,NEW YORK STATE COLL CERAM,ALFRED,NY 14802

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1989年 / 22卷

关键词：

D O I：

10.1107/S0021889888014487

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：238 / 243

页数：6

共 17 条

[1]

BROWN A, 1980, ADV XRAY ANAL, V23, P361

[2] CHOICE OF COLLIMATORS FOR A CRYSTAL SPECTROMETER FOR NEUTRON DIFFRACTION [J].

CAGLIOTI, G ;

PAOLETTI, A ;

RICCI, FP .

NUCLEAR INSTRUMENTS & METHODS, 1958, 3 (04) :223-228

[3] DETERMINATION OF CRYSTALLITE SIZE AND LATTICE-DISTORTIONS THROUGH X-RAY-DIFFRACTION LINE-PROFILE ANALYSIS - RECIPES, METHODS AND COMMENTS [J].

DELHEZ, R ;

DEKEIJSER, TH ;

MITTEMEIJER, EJ .

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1982, 312 (01) :1-16

[4]

HOWARD SA, 1983, ADV XRAY ANAL, V23, P73

[5] The measurement of particle size by the X-ray method [J].

Jones, FW .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1938, 166 (A924) :0016-0043

[6] PROFILE ANALYSIS OF X-RAY POWDER DIFFRACTOMETER DATA - STRUCTURAL REFINEMENT OF LA0.75SR0.25CRO3 [J].

KHATTAK, CP ;

COX, DE .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (OCT1) :405-411

[7] RAPID METHOD FOR ANALYZING BREADTHS OF DIFFRACTION AND SPECTRAL-LINES USING VOIGT FUNCTION [J].

LANGFORD, JI .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1978, 11 (FEB) :10-14

[8]

Parrish W., 1976, T AM CRYSTALLOGR ASS, V12, P55

[9]

PYRROS NP, 1982, J APPL CRYSTALLOGR, V16, P289

[10] A PROFILE REFINEMENT METHOD FOR NUCLEAR AND MAGNETIC STRUCTURES [J].

RIETVELD, HM .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 :65-&

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