AN AVAILABILITY ANALYSIS OF A K-OUT-OF-N-G REDUNDANT SYSTEM WITH DEPENDENT FAILURE RATES AND COMMON-CAUSE FAILURES

被引：19
作者：
CHUNG, WK
机构：
[1] Univ of Ottawa, Ottawa, Ont, Can, Univ of Ottawa, Ottawa, Ont, Can
来源：
MICROELECTRONICS AND RELIABILITY | 1988年 / 28卷 / 03期
关键词：
D O I：
10.1016/0026-2714(88)90395-2
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：391 / 393
页数：3
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