SECONDARY ION MASS-SPECTROMETRY

被引：0

作者：

VICKERMAN, JC

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中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：969 / &

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[1] INSTRUMENTAL ASPECTS OF SECONDARY ION MASS-SPECTROMETRY AND SECONDARY ION IMAGING MASS-SPECTROMETRY
WERNER, HW
VACUUM, 1972, 22 (11) : 613 - 617
[2] SECONDARY ION MASS-SPECTROMETRY
HEDBAVNY, P
CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A, 1974, 24 (04): : C396 - 397
[3] SECONDARY ION MASS-SPECTROMETRY
CAVALLINI, M
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1982, 7 (03): : A50 - A50
[4] SECONDARY ION MASS-SPECTROMETRY
MORRISON, GH
ANALYTICAL CHEMISTRY, 1986, 58 (01) : 1 - 1
[5] SECONDARY ION MASS-SPECTROMETRY
KENWAYJACKSON, C
VACUUM, 1984, 34 (3-4) : 479 - 480
[6] SECONDARY ION MASS-SPECTROMETRY
WILLIAMS, P
ANNUAL REVIEW OF MATERIALS SCIENCE, 1985, 15 : 517 - 548
[7] ION NEUTRALIZATION IN SECONDARY ION MASS-SPECTROMETRY
GARRETT, RF
MACDONALD, RJ
OCONNOR, DJ
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 333 - 335
[8] SECONDARY ION MASS-SPECTROMETRY (SIMS)
ODAWARA, O
DENKI KAGAKU, 1990, 58 (03): : 211 - 217
[9] SECONDARY ION MASS-SPECTROMETRY (SIMS)
SHINODA, G
JOURNAL OF ELECTRON MICROSCOPY, 1975, 24 (01): : 57 - 58
[10] QUANTITATIVE SECONDARY ION MASS-SPECTROMETRY
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JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1988, 93 (03): : 510 - 518