ALTERNATING DONOR-LIKE-ACCEPTOR-LIKE CONFIGURATIONALLY BISTABLE DEFECT IN IRRADIATED PHOSPHORUS-DOPED SILICON

被引:7
作者
AWADELKARIM, OO [1 ]
MONEMAR, B [1 ]
机构
[1] LINKOPING UNIV,DEPT PHYS & MEASUREMENT TECHNOL,S-58183 LINKOPING,SWEDEN
来源
PHYSICAL REVIEW B | 1988年 / 38卷 / 14期
关键词
D O I
10.1103/PhysRevB.38.10116
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:10116 / 10119
页数:4
相关论文
共 24 条
[1]   INTERSTITIAL DEFECT REACTIONS IN SILICON [J].
ASOM, MT ;
BENTON, JL ;
SAUER, R ;
KIMERLING, LC .
APPLIED PHYSICS LETTERS, 1987, 51 (04) :256-258
[2]   DETECTION OF MINORITY-CARRIER DEFECTS BY DEEP LEVEL TRANSIENT SPECTROSCOPY USING SCHOTTKY-BARRIER DIODES [J].
AURET, FD ;
NEL, M .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (07) :2546-2549
[3]  
AWADELKARIM OO, UNPUB
[4]   A BISTABLE DEFECT IN ELECTRON-IRRADIATED BORON-DOPED SILICON [J].
BAINS, SK ;
BANBURY, PC .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1985, 18 (05) :L109-L116
[5]  
BENTON JL, 1983, DEFECTS SEMICONDUCTO, V2, P95
[6]   CONFIGURATIONALLY MULTISTABLE DEFECT IN SILICON [J].
CHANTRE, A ;
KIMERLING, LC .
APPLIED PHYSICS LETTERS, 1986, 48 (15) :1000-1002
[7]   METASTABLE-DEFECT BEHAVIOR IN SILICON - CHARGE-STATE-CONTROLLED REORIENTATION OF IRON-ALUMINUM PAIRS [J].
CHANTRE, A ;
BOIS, D .
PHYSICAL REVIEW B, 1985, 31 (12) :7979-7988
[8]   CONFIGURATIONALLY BISTABLE C-CENTER IN QUENCHED SI-B - POSSIBILITY OF A BORON-VACANCY PAIR [J].
CHANTRE, A .
PHYSICAL REVIEW B, 1985, 32 (06) :3687-3694
[9]   CALCULATION OF CHARGE-DISTRIBUTIONS AND MINORITY-CARRIER INJECTION RATIO FOR HIGH-BARRIER SCHOTTKY DIODES [J].
ELFSTEN, B ;
TOVE, PA .
SOLID-STATE ELECTRONICS, 1985, 28 (07) :721-727
[10]   MINORITY-CARRIER EFFECTS UPON SMALL-SIGNAL AND STEADY-STATE PROPERTIES OF SCHOTTKY DIODES [J].
GREEN, MA ;
SHEWCHUN, J .
SOLID-STATE ELECTRONICS, 1973, 16 (10) :1141-1150