APPLICATION OF JOSEPHSON EDGE TYPE JUNCTIONS WITH A PRBA2CU3O7 BARRIER PREPARED WITH BR-ETHANOL ETCHING OR CLEANING

被引：6

作者：

FALEY, MI ^{[1
]}

POPPE, U ^{[1
]}

JIA, CL ^{[1
]}

DAHNE, U ^{[1
]}

GONCHAROV, Y ^{[1
]}

KLEIN, N ^{[1
]}

URBAN, K ^{[1
]}

GLYANTSEV, VN ^{[1
]}

KUNKEL, G ^{[1
]}

SIEGEL, M ^{[1
]}

机构：

[1] INST SCHICHT & IONENTECH, D-52425 JULICH, GERMANY

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1995年 / 5卷 / 02期

关键词：

D O I：

10.1109/77.403124

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The technique of the edge preparation for multilayer Josephson edge type junctions on the basis of c-axis oriented YBa2Cu3O7 thin films with the help of etching in Br-ethanol solution was improved. Microwave induced Shapiro steps, Josephson radiation, and characteristics of dc-SQUIDs were investigated. The developed technique prevents the junctions and device properties from degradation due to aging or thermal cycling.

引用

页码：2608 / 2611

页数：4

共 9 条

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