METHOD FOR ACCURATE MEASUREMENT OF LATTICE COMPRESSIONS OF LOW-Z MATERIALS AT PRESSURES UP TO 12 GPA BY X-RAY-DIFFRACTION

被引:15
作者
HALLECK, PM [1 ]
OLINGER, B [1 ]
机构
[1] LOS ALAMOS SCI LAB,LOS ALAMOS,NM 87544
关键词
D O I
10.1063/1.1686514
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
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页码:1408 / 1410
页数:3
相关论文
共 18 条
[1]  
ADAMS LH, 1965, AM J SCI, V263, P358
[2]  
Banus M. D., 1969, High Temperatures - High Pressures, V1, P483
[3]  
Drickamer H., 1967, SOLID STATE PHYS, V19, P135
[4]   PRESSURE-DEPENDENCE OF RADIOACTIVE DECAY CONSTANT OF BERYLLIUM-7 [J].
HENSLEY, WK ;
BASSETT, WA ;
HUIZENGA, JR .
SCIENCE, 1973, 181 (4105) :1164-1165
[5]   X-ray diffraction of substances under high pressures [J].
Jacobs, RB .
PHYSICAL REVIEW, 1938, 54 (05) :325-331
[6]   X-RAY DIFFRACTION STUDIES IN 100 KILOBAR PRESSURE RANGE [J].
JAMIESON, JC ;
LAWSON, AW .
JOURNAL OF APPLIED PHYSICS, 1962, 33 (03) :776-+
[7]  
JAMIESON JC, 1971, NBS326 SPEC PUBL
[8]  
MCWHAN DB, 1969, T AM CRYSTALLOG ASSO, V4, P39
[9]  
MORRIS C, PRIVATE COMMUNICATIO
[10]  
Olinger B., 1970, High Temperatures - High Pressures, V2, P513