DETERMINATION OF TRACES OF HAFNIUM IN ZIRCONIUM-OXIDE BY WAVELENGTH DISPERSIVE-X-RAY FLUORESCENCE SPECTROMETRY

被引：5

作者：

HASANY, SM

RASHID, F

RASHID, A

REHMAN, H

机构：

[1] Nuclear Chemistry Division, Pakistan Institute of Nuclear Science and Technology, Islamabad, P. O. Nilore

来源：

JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-ARTICLES | 1990年 / 142卷 / 02期

关键词：

D O I：

10.1007/BF02040321

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

An accurate and precise wavelength dispersive X-ray fluorescence spectrometric method is described for the quantitative analysis of hafnium impurities in zirconium oxide matrix in the range from 6.8 to 1004 μg/g, using the HfLβ1 line on 8420+ XRF Quantometer (ARL) with LiF (220) crystal and scintillation detector. The practical limit of measurement is 6.8 μg/g. The precision is between 1 to 6% for higher and lower concentrations of hafnium, whereas accuracy in most cases is <5%. © 1990 Akadémiai Kiadó.

引用

页码：505 / 514

页数：10

共 10 条

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