HIGH-SPEED DIFFRACTOMETER-REACTION CHAMBER USING SYNCHROTRON RADIATION

A high-speed diffractometer capable of recording diffraction patterns in the time scale of a few milliseconds using a synchrotron x-ray source is described. This instrument is designed to monitor fast, self-propagating high-temperature solid-state synthesis reactions in an inert atmosphere. A vertical theta-2-theta geometry is employed to collect maximum scattering from the horizontally polarized synchrotron beam. The detector system consists of two silicon photodiode arrays each of which can be integrated in as little time as 4 ms with shorter time frames possible if some pixels are skipped. Operation of the detectors, transfer and storage of data, and movement of the motors are controlled by an IBM-AT computer. The design, construction, and subsequent testing and performance at the Brookhaven National Synchrotron Light Source are discussed in detail.