TECHNIQUE FOR DETECTING CRITICAL LOADS IN SCRATCH TEST FOR THIN-FILM ADHESION

被引:24
作者
GREENE, JE
WOODHOUSE, J
PESTES, M
机构
[1] UNIV ILLINOIS, DEPT MET, URBANA, IL 61801 USA
[2] UNIV ILLINOIS, COORDINATED SCI LAB, URBANA, IL 61801 USA
[3] UNIV ILLINOIS, MAT RES LAB, URBANA, IL 61801 USA
[4] UNIV ILLINOIS, DEPT MECH ENGN, URBANA, IL 61801 USA
关键词
D O I
10.1063/1.1686727
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:747 / 749
页数:3
相关论文
共 6 条
[1]   ADHESION OF EVAPORATED METAL FILMS ON GLASS [J].
BENJAMIN, P ;
WEAVER, C .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1961, 261 (1304) :516-+
[2]   STYLUS OR SCRATCH METHOD FOR THIN FILM ADHESION MEASUREMENT - SOME OBSERVATIONS AND COMMENTS [J].
BUTLER, DW ;
STODDART, CT ;
STUART, PR .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1970, 3 (06) :877-&
[3]  
Campbell D.S., 1969, HDB THIN FILM TECHNO
[4]  
CHAPMAN BN, 1969, 7 P C ADH ADH
[5]   SOME FACTORS INFLUENCING THE ADHESION OF FILMS PRODUCED BY VACUUM EVAPORATION [J].
HEAVENS, OS .
JOURNAL DE PHYSIQUE ET LE RADIUM, 1950, 11 (07) :355-360
[6]   On the cleaning of surfaces [J].
Strong, J .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1935, 6 (04) :97-98